• Lopamudra Satapathy Birla Institute of Technology
  • Kunal Mukhopadhyay Department of Bio-Engineering, Birla Institute of Technology, Mesra, Ranchi 835215, India


Wheat, Biotic stress, NFX1, RING finger


Objective: The purpose of this study was to identify and characterize NFX1 transcription factors (TFs) in wheat and study their expression profiles in response to leaf rust infection.

Methods: NFX1 transcription factors were identified by in silico data-mining, followed by characterisation using different bioinformatics tool. The evolutionary relationship was established by constructing a phylogenetic tree with Arabidopsis NFX1 proteins using Molecular Evolutionary Genetic Analysis (MEGA5). Expression analysis of identified TaNFX1 TFs in wheat was performed using CLC Genomics Workbench.

Results: Nine NFX1 transcription factors were identified in wheat. Evolutionary analysis revealed their classification into group 1, 2 and 4 type NFX1 zinc finger. Tag based expression analysis revealed that based on the fold change values, the maximum level of expression was observed in TaNFX1-3 and 7 whereas, the minimum level of expression was observed in TaNFX1-2 in response to leaf rust pathogenesis. Chromosomal localization predicted that identified NFX1 sequences belonged to 3A, 3B, 3D and 7D chromosomes.

Conclusion: Using transcriptomic approach nine NFX1 TF proteins are predicted that regulate gene expression in response to leaf rust disease in wheat which has not been reported or studied before. Functional and bioinformatics-based exploration of wheat NFX1 TFs in related monocots might provide subsets of candidate target genes to improve agronomic traits related to biotic stress tolerance.



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How to Cite

Satapathy, L., and K. Mukhopadhyay. “TRANSCRIPTOME-WIDE ANALYSIS OF NFX1 TRANSCRIPTION FACTORS IN WHEAT (TRITICUM AESTIVUM L.) AND THEIR LEAF RUST RESPONSIVE EXPRESSION PROFILING”. International Journal of Pharmacy and Pharmaceutical Sciences, vol. 8, no. 2, Feb. 2016, pp. 60-65,



Original Article(s)